{"title":"Measuring design quality by measuring design complexity","authors":"M. Keating","doi":"10.1109/ISQED.2000.838861","DOIUrl":null,"url":null,"abstract":"Chips continue to get larger and more complex, and as they do, design quality continues to become more difficult and more important. Improving quality metrics is a key to addressing this problem, both for measuring quality and for predicting design quality early in the design cycle. This paper proposes a method of quantifying design complexity, enabling design teams to produce architectures and implementations that manage complexity, and hence quality, effectively.","PeriodicalId":113766,"journal":{"name":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2000.838861","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 29
Abstract
Chips continue to get larger and more complex, and as they do, design quality continues to become more difficult and more important. Improving quality metrics is a key to addressing this problem, both for measuring quality and for predicting design quality early in the design cycle. This paper proposes a method of quantifying design complexity, enabling design teams to produce architectures and implementations that manage complexity, and hence quality, effectively.