A brief overview of Test Solution Development for Semiconductor Testing

Abstract

Semiconductor industries perform testing to ensure good performance of the device under different operating conditions. The time consumed in testing the device by traditional testing methods using multimeter is considerably high and the results are subject to manual errors. Thus, an automatic test equipment (ATE), which is a compact complex circuitry involving current/voltage forcing and measuring units, is used to reduce the test time and obtain accurate results. The paper presents a test solution development for a cable controller generation 3 (CCG3) wafer which is a type-C universal serial bus (USB). The first step is development of the test requirements document (TRD). Next, a TRD parser is developed which is a java-based tool that automatically generates the test program by using the TRD as an input. Finally, the generated test program is validated on an Advantest V93000 tester based on the Smartest8 (SMT8) platform. The TRD parser automatically generates the complete test program in 3.168s and 100% test coverage is achieved on the V93000 tester for the continuity tests. The paper thus covers the entire flow of testing a device under test (DUT) using an ATE at wafer level.