Research of physical properties of TiO2 nanolayers for integrated photonics applications

P. Struk, T. Pustelny
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Abstract

The paper presents investigation of physical properties of wide bandgap oxide semiconductor – titanium dioxide for applications in integrated photonics as well as for future applications in gas sensors structures. The investigation presented in the paper was focused on: surface topography of TiO2 layer measured by AFM method, as well as investigation of Raman shift obtained by Raman spectroscopy. Finally the integrated photonics in the form of planar waveguide is also presented.
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集成光子学应用中TiO2纳米层的物理性质研究
本文介绍了用于集成光子学和未来气体传感器结构的宽禁带氧化物半导体二氧化钛的物理性质。本文主要研究了:原子力显微镜法测量TiO2层的表面形貌,以及拉曼光谱法获得的拉曼位移。最后介绍了平面波导形式的集成光子学。
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