A Deep Learning-based Microsection Measurement Framework for Print Circuit Boards

Chia-Yu Lin, Chieh-Ling Li, Yu-Chiao Kuo, Yun-Chieh Cheng, C. Jian, Hsiang-Ting Huang, Mitchel M. Hsu
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Abstract

Microsectioning is a destructive testing procedure used in the printed circuit board (PCB) fabrication industry to evaluate the quality of PCBs. During cross-section analysis, operators measure PCB component widths manually, which can lead to inconsistencies and make it challenging to establish standardized procedures. We propose a Deep Learning-based Microsection Measurement (DL-MM) Framework for PCB microsection samples to address this issue. The framework comprises four modules: the target detection module, the image preprocessing module, the labeling model, and the coordinate adaptation module. The target detection module is responsible for extracting the area of interest to be measured, which reduces the influence of surrounding noise and improves measurement accuracy. In the image preprocessing module, the target area image is normalized, labeled with coordinates, and resized to different sizes based on the class. The labeling model utilizes a convolutional neural network (CNN) model trained separately for each class to predict its punctuation, as the number of coordinates varies for each class. The final module is the coordinate adaptation module, which utilizes the predicted coordinates to draw a straight line on the expected image for improved readability. In addition, we evaluate the proposed framework on two types of microsections, and the experimental results show that the measurements’ root-mean-square error (RMSE) is only 2.1 pixels. Our proposed framework offers a more efficient, faster, and cost-effective alternative to the traditional manual measurement method.
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基于深度学习的印刷电路板微截面测量框架
微切片是印刷电路板(PCB)制造行业中用于评估PCB质量的破坏性检测方法。在横截面分析过程中,操作人员手动测量PCB元件宽度,这可能导致不一致,并使建立标准化程序具有挑战性。我们提出了一个基于深度学习的PCB微切片测量(DL-MM)框架来解决这个问题。该框架包括四个模块:目标检测模块、图像预处理模块、标注模型和坐标自适应模块。目标检测模块负责提取待测感兴趣区域,减少了周围噪声的影响,提高了测量精度。在图像预处理模块中,对目标区域图像进行归一化,标记坐标,并根据类调整大小。标记模型利用卷积神经网络(CNN)模型为每个类别单独训练来预测其标点符号,因为每个类别的坐标数量不同。最后一个模块是坐标适配模块,利用预测的坐标在期望的图像上画一条直线,提高可读性。此外,我们在两种类型的显微切片上对所提出的框架进行了评估,实验结果表明,测量结果的均方根误差(RMSE)仅为2.1像素。我们提出的框架为传统的人工测量方法提供了一种更有效、更快和更具成本效益的替代方案。
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