If You Can Measure It, You Can Manage It: A Case of Intellectual Capital

Muhammad Nadeem, John Dumay, M. Massaro
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引用次数: 63

Abstract

Despite the great importance attributed to Intellectual Capital (IC) in the past two decades or so, its measurement and management have remained elusive, mainly because of inappropriate prior models of IC measurement. The purpose of this study was, therefore, to make adjustments to an existing model, the Value Added Intellectual Coefficient (VAIC), and present an adjusted-VAIC model to measure IC. We tested our new model on data from ten emerging and developed markets of the world and obtained more consistent results than prior studies. Our results indicate a significant positive relationship between IC and its components (human, innovation and physical capitals) and firm performance. Therefore, the Adjusted-VAIC can be used with confidence to measure IC. Our study has important implications for both academia and industry concerning the measurement of IC.
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如果你能衡量它,你就能管理它:一个智力资本的案例
尽管在过去的二十年里,智力资本(IC)得到了极大的重视,但其测量和管理仍然难以捉摸,主要是因为先前的IC测量模型不合适。因此,本研究的目的是对现有的智力增值系数(VAIC)模型进行调整,并提出一个调整后的VAIC模型来衡量智力增值系数。我们在世界上10个新兴市场和发达市场的数据上测试了我们的新模型,得到了比以前研究更一致的结果。我们的研究结果表明,集成电路及其组成部分(人力、创新和实物资本)与企业绩效之间存在显著的正相关关系。因此,调整后的vaic可以可靠地用于IC测量。我们的研究对学术界和工业界有关IC测量的重要意义。
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