J. Messina, D. Bowman, R. Filler, R. Lindenmuth, V. Rosati, S. Schodowski
{"title":"Results of long term testing of tactical miniature crystal oscillators","authors":"J. Messina, D. Bowman, R. Filler, R. Lindenmuth, V. Rosati, S. Schodowski","doi":"10.1109/FREQ.1989.68833","DOIUrl":null,"url":null,"abstract":"The results of long-term testing of the tactical miniature crystal oscillator (TMXO) are presented. The TMXO uses high-vacuum thermal insulation, microelectronic packaging, and a precision ceramic-flatpack-enclosed SC-cut crystal. Engineering models and pilot-production models, delivered under a Manufacturing Methods and Technology effort with the Bendix Division of Allied Corporation, were subjected to a variety of tests that included turn-on/turn-off at temperature extremes, input-power aging, and frequency aging. The testing verified the ability of the TMXO to maintain vacuum integrity over a reasonable lifetime (10 years).<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 43rd Annual Symposium on Frequency Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1989.68833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The results of long-term testing of the tactical miniature crystal oscillator (TMXO) are presented. The TMXO uses high-vacuum thermal insulation, microelectronic packaging, and a precision ceramic-flatpack-enclosed SC-cut crystal. Engineering models and pilot-production models, delivered under a Manufacturing Methods and Technology effort with the Bendix Division of Allied Corporation, were subjected to a variety of tests that included turn-on/turn-off at temperature extremes, input-power aging, and frequency aging. The testing verified the ability of the TMXO to maintain vacuum integrity over a reasonable lifetime (10 years).<>
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