{"title":"Construction of MRAM reliability test platform","authors":"R. Zhou, Yizhe Zhang, Q. Shi, K. Cao","doi":"10.1142/9789814740135_0059","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":411065,"journal":{"name":"Electronics, Electrical Engineering and Information Science","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronics, Electrical Engineering and Information Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/9789814740135_0059","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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