{"title":"A quantitative method for evaluating the quality of analog layout","authors":"P. B. Wu, R. Mack, R. Massara","doi":"10.1109/MWSCAS.2000.951416","DOIUrl":null,"url":null,"abstract":"A quantitative benchmarking metric is presented for the objective evaluation of the quality of analog layout. It facilitates comparisons between alternative design automation tools, and, for a given tool, provides the assessment of each layout instance. The quality metric reflects two principal concerns in layout design: area efficiency and net-routing optimality. The results demonstrate the effectiveness of the metric in that the calculated scores provide a characterization that corresponds to expert designers' judgements.","PeriodicalId":437349,"journal":{"name":"Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems (Cat.No.CH37144)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 43rd IEEE Midwest Symposium on Circuits and Systems (Cat.No.CH37144)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2000.951416","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A quantitative benchmarking metric is presented for the objective evaluation of the quality of analog layout. It facilitates comparisons between alternative design automation tools, and, for a given tool, provides the assessment of each layout instance. The quality metric reflects two principal concerns in layout design: area efficiency and net-routing optimality. The results demonstrate the effectiveness of the metric in that the calculated scores provide a characterization that corresponds to expert designers' judgements.
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