{"title":"Using Modularity to Improve Microwave Instrumentation","authors":"M. Roos","doi":"10.1109/ARFTG.1987.323860","DOIUrl":null,"url":null,"abstract":"So in summary, what EIP is offering in the modular measurement workstation is a way for design and test engineers to a) very cost-effectively configure a total measurement solution, not individual measurement instruments: b) tailor a measurement solution for a particular application and c) give customers a very good upgrade path to continue to enhance the system to meet emerging needs.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1987.323860","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
So in summary, what EIP is offering in the modular measurement workstation is a way for design and test engineers to a) very cost-effectively configure a total measurement solution, not individual measurement instruments: b) tailor a measurement solution for a particular application and c) give customers a very good upgrade path to continue to enhance the system to meet emerging needs.
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