Silvia Fabiani, D. Mencarelli, A. di Donato, T. Monti, G. Venanzoni, A. Morini, T. Rozzi, M. Farina
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引用次数: 35
Abstract
In this work we describe the application of a dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) - developed by ourselves- to a graphene flake. In our system we introduce a conversion in Time-Domain to discriminate the desired information, achieving high quality microwave images with nanometric resolution. The graphene sample is deposited on a substrate of SiO2 with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidence of localized change of impedance near the edge of the flake.
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