{"title":"ESD and latchup: Computer aided design (CAD) tools and methodologies for today and future VLSI designs","authors":"S. Voldman","doi":"10.1109/ICASIC.2007.4415645","DOIUrl":null,"url":null,"abstract":"In summary, new methods for ESD and latchup analysis are being utilized to address today's technical problems in products, and design tools. As semiconductor tool and product complexity increases, future concepts are needed to address system on chip integration problems.","PeriodicalId":120984,"journal":{"name":"2007 7th International Conference on ASIC","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 7th International Conference on ASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICASIC.2007.4415645","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
In summary, new methods for ESD and latchup analysis are being utilized to address today's technical problems in products, and design tools. As semiconductor tool and product complexity increases, future concepts are needed to address system on chip integration problems.
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