Towards cognitive built-in-self-test (BIST) for reconfigurable on-chip applications, and contact-less measurement

Abstract

This paper introduces the concept of cognitive wireless BIST system for reconfigurability of on-chip function blocks, towards contactless measurement and characterization of high frequency integrated systems. Proposed feasibility studies of cognitive BIST cover characterization of chip-to-chip noise interferences as function of wireless coupling-path attributes (wireless separation distance between emitter and receiver chips, injected power levels, Charge-Pump-Current). Study of BIST for reconfigurability of on-chip functions is conducted based on design of programmable automatic amplitude control (ALC) of PLL reference oscillators. Impacts of BIST circuits on system performances are evaluated based on simulation analysis and experimental verifications.