Y. Antonioli, T. Inufushi, S. Nishikawa, K. Kinoshita
{"title":"A high-speed IDDQ sensor implementation","authors":"Y. Antonioli, T. Inufushi, S. Nishikawa, K. Kinoshita","doi":"10.1109/ATS.2000.893649","DOIUrl":null,"url":null,"abstract":"This paper presents an effective IDDQ sensor design implemented using a 0.35 /spl mu/m process. A straightforward feedback scheme minimizes the effect of process variations. Independent structures permit one to monitor the basic characteristics of the IDDQ sensor, i.e., resolution and speed, and to carry out a 20k-gate floppy-disk controller IDDQ test separately. Simulation and test results show accuracy better than /spl plusmn/10 /spl mu/A at 50 MHz in a 1 mA IDDQ measurement range.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Ninth Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2000.893649","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper presents an effective IDDQ sensor design implemented using a 0.35 /spl mu/m process. A straightforward feedback scheme minimizes the effect of process variations. Independent structures permit one to monitor the basic characteristics of the IDDQ sensor, i.e., resolution and speed, and to carry out a 20k-gate floppy-disk controller IDDQ test separately. Simulation and test results show accuracy better than /spl plusmn/10 /spl mu/A at 50 MHz in a 1 mA IDDQ measurement range.
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