Microwave Performance Of Single-gate And Dual-gate Modfets Using Double Hetero'unction Modulation-doped Structures

Y. Chen, G. W. Wang, D. Radulescu, A. Lepore, P. Tasker, L. Eastman
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Abstract

1.2-/spl mu/m and 0.3-/spl mu/m gate length n+-GaAs/InGaAs/n+-AlGaAs Double Heterojunction Modulation-Doped Field-Effect Transistors (DH-MODFETs)have been fabricated with single and dual controlling gate electrodes. Extrinsic DC transconcluclance of 500 mS/mm has been achieved for a 0.3-/spl mu/m single-gate FET. The device also has an f/sub T/ of 43 GHz and 14 dB Maximum Stable Gain (MSG) at 26 GHz with the stability factor (k) as low as 0.6 from the small signal s-parameter measurements from 0.5 to 26.5 GHz. Dual gate FETs fabricated on the same wafer demonstrate higher gain at low frequencies, but the gain decreases rapidly at high frequencies with the stability factor reaching unity at a rate faster than that single-gate DH-MODFETs. Distinctive power gain roll-off slopes of -3, -6, and -12 dB/octave have been observed forthe dual-gate MODFETs.
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采用双异质功能调制掺杂结构的单门和双门器件的微波性能
分别制备了栅极长度为1.2-/spl mu/m和0.3-/spl mu/m的n+- gaas /InGaAs/n+- algaas双异质结调制掺场效应晶体管(h - modfet)。对于0.3-/spl mu/m的单栅极场效应管,已经实现了500 mS/mm的外部直流通结。该器件还具有43 GHz的f/sub /和26 GHz时14 dB的最大稳定增益(MSG),在0.5至26.5 GHz的小信号s参数测量中稳定因子(k)低至0.6。在同一晶片上制造的双栅极fet在低频时具有较高的增益,但在高频时增益下降迅速,稳定系数达到单位的速度比单栅极dh - modfet快。双栅极modfet的显著功率增益滚降斜率为-3、-6和-12 dB/倍频。
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