{"title":"Non destructive crack detection at X-band","authors":"P. Das, S. B. Belamgi, S. Ray","doi":"10.1109/ICECI.2014.6767371","DOIUrl":null,"url":null,"abstract":"Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.","PeriodicalId":315219,"journal":{"name":"International Conference on Electronics, Communication and Instrumentation (ICECI)","volume":"88 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Electronics, Communication and Instrumentation (ICECI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECI.2014.6767371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Non Destructive Testing (NDT) technique is one of the most challenging areas for researchers working in the field of microwave. In the present paper, use of open-ended T-Junction sensor was studied for detection of 3D cracks with rectangular aperture on a metal surface in X-Band. This technique shows better resolution with compared to other reported microwave NDT techniques.