Energy aware and reliable STT-RAM based cache design for 3D embedded chip-multiprocessors

Fatemeh Arezoomand, Arghavan Asad, M. Fazeli, M. Fathy, F. Mohammadi
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引用次数: 5

Abstract

In Nano-scale technologies, static power consumption due to leakage current has become a serious issue in the design of SRAM based on-chip cache memories. To address this issue, non-volatile memory technologies such as STT-RAM (Spin Transfer Torque-RAM) have been proposed as a replacement for SRAM cells due to their near zero static power consumption and high memory density. Nonetheless, STT-RAMs suffer from some failures such as read disturb and limited endurance as well as high switching energy. One effective way to decrease the STT-RAMs' switching energy is to reduce their retention time, however, reducing the retention time has a negative impact on the reliability of STT-RAM cells. In this paper, we propose a hybrid cache layer for an embedded 3D-Chip Multiprocessor which employs two types of STT-RAM memory banks with retention time of 1s and 10ms to provide a beneficial tradeoff between reliability, energy consumption, and performance. To this end, we also propose an optimization model to find the optimal configurations for these two kinds of memory banks. Simulation results using the Gem5 simulator through comparisons with fully SRAM and fully STT-RAM based cache show that the proposed hybrid cache consumes significantly less power while offering higher throughput (instructions per cycle) compared to a fully STT-RAM based cache.
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基于STT-RAM的3D嵌入式芯片多处理器缓存设计
在纳米技术中,泄漏电流引起的静态功耗已成为基于片上高速缓存的SRAM设计中的一个严重问题。为了解决这个问题,人们提出了非易失性存储技术,如STT-RAM(自旋传输扭矩- ram),作为SRAM单元的替代品,因为它们几乎为零的静态功耗和高存储密度。然而,stt - ram存在一些故障,如读干扰和有限的寿命,以及高开关能量。降低STT-RAM开关能量的有效方法之一是减少其保留时间,但减少保留时间会对STT-RAM电池的可靠性产生负面影响。在本文中,我们提出了一种用于嵌入式3d芯片多处理器的混合缓存层,该处理器采用两种类型的STT-RAM存储器,保留时间分别为1s和10ms,以在可靠性,能耗和性能之间提供有益的权衡。为此,我们还提出了一个优化模型来寻找这两种存储库的最优配置。通过与完全基于SRAM和完全基于STT-RAM的缓存进行比较,使用Gem5模拟器的仿真结果表明,与完全基于STT-RAM的缓存相比,所提出的混合缓存消耗的功率显着降低,同时提供更高的吞吐量(每周期指令)。
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