M. Heertjes, Maurice L. J. van de Ven, Ramidin Kamidi
{"title":"Acceleration-snap feedforward scheme for a motion system with viscoelastic tuned-mass-damper","authors":"M. Heertjes, Maurice L. J. van de Ven, Ramidin Kamidi","doi":"10.23919/ACC.2017.7963389","DOIUrl":null,"url":null,"abstract":"Bandwidth-limiting flexible modes in motion systems like the stage systems of a wafer scanner can effectively be damped by incorporating a viscoelastic tuned-mass-damper. This allows for an increase of bandwidth. The viscoelastic properties however pose a challenge on the feedforward design and thereby limit the achievable tracking performance. This is because the viscoelastic properties, which cannot be described by the simple addition of an elastic and a viscous element, induce a relaxation effect that prolongs well beyond the moment that inertial forces induced by the setpoint are being applied to the system. To cope with this problem, a tenth-order model fit from measured frequency response data that sufficiently captures the viscoelastic properties is combined with a data-based optimization approach needed to fine-tune a limited set of acceleration-snap feedforward gains. Experimental results from an industrial wafer stage system demonstrate the applicability of the approach.","PeriodicalId":422926,"journal":{"name":"2017 American Control Conference (ACC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 American Control Conference (ACC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ACC.2017.7963389","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Bandwidth-limiting flexible modes in motion systems like the stage systems of a wafer scanner can effectively be damped by incorporating a viscoelastic tuned-mass-damper. This allows for an increase of bandwidth. The viscoelastic properties however pose a challenge on the feedforward design and thereby limit the achievable tracking performance. This is because the viscoelastic properties, which cannot be described by the simple addition of an elastic and a viscous element, induce a relaxation effect that prolongs well beyond the moment that inertial forces induced by the setpoint are being applied to the system. To cope with this problem, a tenth-order model fit from measured frequency response data that sufficiently captures the viscoelastic properties is combined with a data-based optimization approach needed to fine-tune a limited set of acceleration-snap feedforward gains. Experimental results from an industrial wafer stage system demonstrate the applicability of the approach.