Precision millimeter and submillimeter wave measurements of material properties

Abstract

Dielectric measurement techniques developed over last twelve years are reviewed. Varieties of measurement techniques are necessary in order to cope with material problems such as absorption characteristics, size and thickness, shape and temperature and frequency coverage. Precision data are now required on absorption coefficient, refractive index, real and imaginary parts of dielectric permittivity and loss tangent for varieties of classes of materials over a wide frequency range for applications such as substrate, window and lens material, as dielectric waveguide, quarter wave plates, insulators and in integrated circuitry.