Study on the Calibration Method and Measurement of Coincidence Degree in an Infrared Compound-Eye Imaging System

Abstract

In order to improve the spatial coincidence measurement accuracy of position and size for the synthetic target image in current infrared target simulator, a calibration and measuring method of coincidence degree for infrared compound-eye imaging is proposed. Firstly, the mask assembly is employed to block the untested compound-eye subsystem, and the central field-of-view of the target simulator is used as the measuring benchmark. Then, the sub-imaging system is sampled and detected. Finally, the coordinate centroids of the feature points in each sub-image are counted to calibrate the imaging dispersion by the maximum relative error of the centroid pixel. The measured result shows that the image coincidence degree of the measured infrared target simulator can reach up to 80.8%. The factors affecting the spatial coincidence degree of synthetic target image in an infrared target simulator are also analyzed. The analysis results indicate that the coincidence degree of synthetic target image is mainly related to the following two factors: the geometric error of lithography target and the focal position consistency of compound-eye lens array, which is mainly influenced by the errors of vector height and radius of curvature for the compound eye lens array and the lens surface distortion.