Realization of Multilayer Diffractive Components Experimental Methods of Characterization

H. Giovannini, H. Akhouayri, C. Amra
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Abstract

It has been shown that multilayer coatings permit to modify the optical properties of diffraction gratings[1], which increases the fields of application of gratings, especially in micro­optics domain. For example, the efficiency of a grating for s or p polarization can be varied by depositing an optical coating on the diffracting surface[2]. Several techniques can be used to realize such components. One can mention the evaporation techniques (Electron Beam Deposition, Ion Assisted Deposition, Ion Plating) already used for thin film applications. These techniques have been used in our laboratory to realize various diffractive components. The optical properties (efficiency of diffracted orders and phase difference of the scattered field between s and p polarizations) of such components, have been measured by using two devices: one based on a goniometric ellipsometer[3], the other based on a recently developed grating interferometer[4]. The results obtained with these two techniques have been analyzed and compared to the results given by a numerical simulation based on a rigourous method, and the absorption has been measured by using a photothermal technique[5].
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多层衍射元件实验表征方法的实现
研究表明,多层涂层可以改变[1]衍射光栅的光学特性,从而扩大了光栅的应用领域,特别是在微光学领域。例如,可以通过在衍射表面沉积光学涂层来改变s或p偏振光栅的效率。可以使用几种技术来实现这些组件。我们可以提到已经用于薄膜应用的蒸发技术(电子束沉积、离子辅助沉积、离子镀)。这些技术已在我们的实验室中用于实现各种衍射元件。这些元件的光学特性(衍射阶数的效率和s偏振和p偏振之间散射场的相位差)已经用两种装置测量:一种是基于角形椭偏仪[3],另一种是基于最近开发的光栅干涉仪[4]。对这两种方法得到的结果进行了分析,并与基于严格方法的数值模拟结果进行了比较,并利用光热技术[5]测量了吸收。
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