Complete microwave characterization at 36 GHz of YBaCuO thin films deposited on MgO substrates. Influence of the substrate preparation

M. Achani, N. Bourzgui, J. Carru, A. Dégardin, A. Gensbittel, A. Kreisler
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Abstract

This paper deals with the determination of λ and Zs of YBa 2 Cu 3 O 7-δ thin films deposited on MgO single-crystals, from 36 GHz resonant conical cavity measurements performed in the 25 K to 300 K temperature range. The results are discussed in relation with DC electrical transport properties of the films and also with substrate preparation prior to YBaCuO deposition.
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在MgO衬底上沉积的YBaCuO薄膜在36 GHz完成微波表征。衬底制备的影响
本文研究了沉积在MgO单晶上的YBa 2 Cu 3 O 7-δ薄膜的λ和Zs的测定,在25k到300k的温度范围内进行了36ghz谐振锥形腔测量。讨论了这些结果与薄膜的直流电输运特性的关系,以及与沉积YBaCuO之前的衬底制备的关系。
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