Multi-Phase Fault Detection and Analysis in FPGA Interconnects

Shilpa Dandoti, V. D. Mytri
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Abstract

With the increase in integration density in FPGA devices, the possibility of interconnect faults are increasing. Various fault diagnosis approach were observed for the detection of faults in FPGA, through the conventional ATE. These devices are designed for the detection of logical faults occurring in the operation of the FPGA. The ATE devices are currently designed to diagnosis the FPGA operation for faults and intern the fault detection is rectified by reprogramming the device. The localization of such faults will result in faster fault diagnosis. In this paper an approach for faults in FPGA interconnects is developed called forward tree coding. The approach is developed to isolate the fault region in a defined FPGA to reduce the time to market of digital devices. The designing and realization of the suggested approach on a targeted Xilinx device is also developed to evaluate its real time feasibility.
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FPGA互连中的多相故障检测与分析
随着FPGA器件集成密度的增加,出现互连故障的可能性也在增加。观察了各种故障诊断方法,通过传统的ATE检测FPGA中的故障。这些器件设计用于检测FPGA运行中发生的逻辑故障。ATE设备目前设计用于诊断FPGA操作的故障,并通过重新编程设备来纠正故障检测。对此类故障进行定位,可以更快地进行故障诊断。本文提出了一种针对FPGA互连故障的前向树编码方法。该方法用于隔离定义FPGA中的故障区域,以缩短数字器件的上市时间。本文还对该方法在Xilinx目标器件上的设计和实现进行了研究,以评估其实时可行性。
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