Copper Oxide Formations under Polymer Coatings during Accelerated Thermal Aging

Lukas L. Korcak, D. Culliton
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Abstract

Enameled wires are used in solenoids, electrical actuators, and rotor and stator windings in electric machines. These wires typically comprise copper conductors, which are preferred for their balance between cost and current carrying capacity, combined with a dielectric insulating layer. This insulation is made from polymeric materials, which can provide high dielectric strength with a relatively thin coating layer. The downside of these polymers is their inherent oxygen permeability, which may have an effect on the degradation phenomena associated with the conductor material. The main focus is typically on either the conductor or the insulator, but it does not consider collective antagonistic/synergistic interactions. The results presented in this paper outline a preliminary analysis of the interaction between the conductor and the insulation layer(s), focusing primarily on the interfacial region. Thermal degradation at the copper conductor/enamel insulation interface at 250ºC for five aging time periods (100 to 500 hours) is reported. The oxidation processes of copper were studied using X-ray Photo-Electron Spectroscopy. The impact of exposure time on the type and amount of each oxide was analyzed and was related to the identified degradation phenomena.
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加速热老化过程中聚合物涂层下的氧化铜形成
漆包线用于螺线管、电动执行器以及电机的转子和定子绕组。这些电线通常由铜导体组成,铜导体与介电绝缘层结合在一起,在成本和载流能力之间取得了平衡。这种绝缘是由聚合物材料制成的,它可以用相对薄的涂层提供高介电强度。这些聚合物的缺点是它们固有的氧渗透性,这可能会影响与导体材料相关的降解现象。主要焦点通常集中在导体或绝缘体上,但不考虑集体拮抗/协同相互作用。本文提出的结果概述了导体与绝缘层之间相互作用的初步分析,主要集中在界面区域。报道了铜导体/搪瓷绝缘界面在250℃下的5个老化周期(100 ~ 500小时)的热降解。用x射线光电子能谱法研究了铜的氧化过程。分析了暴露时间对各种氧化物类型和数量的影响,并与所识别的降解现象有关。
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