Characteristic of low temperature of Bi-In-Sn solder alloy

Ervina Efzan Mhd Noor, A. B. Ismail, N. M. Sharif, T. Ariga, Zuhailawati Hussain
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引用次数: 8

Abstract

Due to the increase in the use of electronics devices within the industry, the usage of solder connections has increased. These is a concern that lead within the electronic products is considered toxic because lead has potential for leaching from landfills onto water sources and becoming a hazard to human health and surrounding environment. For this reason, replacing Sn-37Pb to free solder with low melting temperature is one of the most important issues in electronic industry. This is due to a demand on low temperature for interconnection and polymer based part component such as LCD display functionality availability at low temperature apply. In this paper, Bi-In-Sn system alloy was investigated as a potential candidate replacing Sn-37Pb. This study covers on solder characteristic such as melting temperature, thermal expansion and microstructure. Bi-In-Sn was prepared and melted in crucible. Solder was cleaned mechanical and chemical before characterized. DSC shows that, Bi-In-Sn system alloy give low melting temperature in range of 65-100°C. The addition of In to Bi-Sn system alloy lowered the melting temperature compared than Sn-37Pb. Lowest melting temperature ensures that the solder melts, forms a joint with the substrates, and re-solidifies within the shortest possible process time. From thermal expansion analysis, it was found that Bi-In-Sn gives good expansion properties to avoid mismatch between Cu pads and solder itself. EDX analysis indicated that, there are two obvious regions in Bi-In-Sn system alloy microstructure. Bright colour refers to BiIn rich phase region and dark colour refers to Sn rich phase region. BiIn rich phase region is higher compared to Sn rich phase in solder give good properties in terms of ductility.
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Bi-In-Sn钎料合金的低温特性
由于行业内电子设备的使用增加,焊料连接的使用也增加了。令人关注的是,电子产品中的铅被认为是有毒的,因为铅有可能从垃圾填埋场浸出到水源中,对人类健康和周围环境构成危害。因此,将Sn-37Pb替换为低熔化温度的游离焊料是电子工业中最重要的问题之一。这是由于对低温互连和基于聚合物的部件组件的需求,例如LCD显示功能在低温下的可用性。本文研究了Bi-In-Sn系合金作为替代Sn-37Pb的潜在候选材料。本研究涵盖焊料的特性,如熔化温度、热膨胀和微观结构。制备了Bi-In-Sn并在坩埚中熔化。焊料在进行表征前进行了机械和化学清洗。DSC表明,Bi-In-Sn系合金的熔点较低,在65 ~ 100℃范围内。与Sn-37Pb相比,添加In降低了Bi-Sn系合金的熔化温度。最低熔化温度确保焊料熔化,与基板形成连接,并在最短的工艺时间内重新固化。从热膨胀分析中发现,Bi-In-Sn具有良好的膨胀性能,避免了铜焊盘与焊料本身的失配。EDX分析表明,Bi-In-Sn系合金组织中存在两个明显的区域。颜色亮的为富BiIn相区,颜色暗的为富Sn相区。焊料中富铋相区比富锡相区高,具有良好的延展性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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