{"title":"Strategies for functional testing of microprocessors","authors":"A. Noore, B.E. Weinrich","doi":"10.1109/SSST.1990.138184","DOIUrl":null,"url":null,"abstract":"Effective strategies for generating tests for microprocessors are presented. Modular block, comprehensive instruction set, and microinstruction set approaches are proposed. These practical approaches are viable alternatives to the exhaustive testing which aims at considering all possible instructions, addressing modes and data patterns. The proposed approaches are versatile and effective, especially in the user environment.<<ETX>>","PeriodicalId":201543,"journal":{"name":"[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSST.1990.138184","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Effective strategies for generating tests for microprocessors are presented. Modular block, comprehensive instruction set, and microinstruction set approaches are proposed. These practical approaches are viable alternatives to the exhaustive testing which aims at considering all possible instructions, addressing modes and data patterns. The proposed approaches are versatile and effective, especially in the user environment.<>