{"title":"EMC test specification for integrated circuits","authors":"F. Klotz","doi":"10.1109/EMCZUR.2007.4388199","DOIUrl":null,"url":null,"abstract":"This paper presents a general EMC test specification for integrated circuits that is based on the internationally standardised test methods set out in IEC 61967 and IEC 62132 and specifies a generic procedure enabling a comparative characterisation of the EMC behaviour of different IC types. The specification contains general information about the test methods used, defines various IC function modules, pin types, and test and measurement networks, and provides a guide to selecting the pins to be tested, operating modes and limit values.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2007.4388199","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper presents a general EMC test specification for integrated circuits that is based on the internationally standardised test methods set out in IEC 61967 and IEC 62132 and specifies a generic procedure enabling a comparative characterisation of the EMC behaviour of different IC types. The specification contains general information about the test methods used, defines various IC function modules, pin types, and test and measurement networks, and provides a guide to selecting the pins to be tested, operating modes and limit values.
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