{"title":"Degradation of Elevated-Metal Metal-Oxide Thin-Film Transistors Under AC Bias Stress","authors":"Yilin Yang, Xiangyuan Yin, Mingxiang Wang, Dongli Zhang","doi":"10.1109/CAD-TFT.2018.8608113","DOIUrl":null,"url":null,"abstract":"Stability of conventional and elevated-metal metal-oxide (EMMO) amorphous indium-gallium-zinc oxide (a-IGZO) thin-film transistors (TFTs) under AC bias stress is investigated. Superior stability of the EMMO TFTs is observed and attributed to the reduced deep acceptor-like trap states.","PeriodicalId":146962,"journal":{"name":"2018 9th Inthernational Conference on Computer Aided Design for Thin-Film Transistors (CAD-TFT)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 9th Inthernational Conference on Computer Aided Design for Thin-Film Transistors (CAD-TFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAD-TFT.2018.8608113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Stability of conventional and elevated-metal metal-oxide (EMMO) amorphous indium-gallium-zinc oxide (a-IGZO) thin-film transistors (TFTs) under AC bias stress is investigated. Superior stability of the EMMO TFTs is observed and attributed to the reduced deep acceptor-like trap states.
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