Bridge Defect Diagnosis for Multiple-Voltage Design

Abstract

Multiple-voltage is an effective dynamic power reduction design technique, commonly used in low power ICs. To the best of our knowledge there is no reported work for diagnosing multiple-Vdd enabled ICs and the aim of this paper is to propose a method for diagnosing bridge defects in such ICs. Using synthesized ISCAS benchmarks, with realistic extracted bridges and parametric fault model; the paper investigates the impact of varying supply voltage on the accuracy of diagnosis and demonstrates how the additional voltage settings can be leveraged to improve the diagnosis resolution through a novel multi-Vdd diagnosis algorithm.