Single-point-detection slew-rate enhancement circuits for single-stage amplifiers

2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353) Pub Date : 2002-08-07 DOI:10.1109/ISCAS.2002.1011482

Hoi Lee, P. Mok

{"title":"Single-point-detection slew-rate enhancement circuits for single-stage amplifiers","authors":"Hoi Lee, P. Mok","doi":"10.1109/ISCAS.2002.1011482","DOIUrl":null,"url":null,"abstract":"Most slew rate enhancement circuits can either be used in current-mirror amplifiers or folded-cascode amplifiers, but not in both. In this paper, a new class of slew rate enhancement (SRE) circuits is proposed. By using a single-point detection (SPD) technique at the active load device of the core amplifier to sense the fast signal transient, the new SRE circuits can be used in both current-mirror and folded-cascode amplifiers. In addition, the simple SRE circuits serve as a plug-in feature to the core amplifier and do not affect its original small-signal frequency response. Implemented by an AMS 0.6 /spl mu/m CMOS process, the current-mirror amplifier with SRE circuit occupies an area of 0.027 mm/sup 2/ and achieves 1.5 V//spl mu/s slew rate with 470 pF capacitive load while only dissipating 90 /spl mu/A total static current. Similarly, the folded-cascode amplifier with SRE circuit occupies an area of 0.03 mm/sup 2/ and achieves 1.52 V//spl mu/s slew rate with 470 pF loading while only 84 /spl mu/A total static current is dissipated.","PeriodicalId":203750,"journal":{"name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2002.1011482","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 10

Abstract

Most slew rate enhancement circuits can either be used in current-mirror amplifiers or folded-cascode amplifiers, but not in both. In this paper, a new class of slew rate enhancement (SRE) circuits is proposed. By using a single-point detection (SPD) technique at the active load device of the core amplifier to sense the fast signal transient, the new SRE circuits can be used in both current-mirror and folded-cascode amplifiers. In addition, the simple SRE circuits serve as a plug-in feature to the core amplifier and do not affect its original small-signal frequency response. Implemented by an AMS 0.6 /spl mu/m CMOS process, the current-mirror amplifier with SRE circuit occupies an area of 0.027 mm/sup 2/ and achieves 1.5 V//spl mu/s slew rate with 470 pF capacitive load while only dissipating 90 /spl mu/A total static current. Similarly, the folded-cascode amplifier with SRE circuit occupies an area of 0.03 mm/sup 2/ and achieves 1.52 V//spl mu/s slew rate with 470 pF loading while only 84 /spl mu/A total static current is dissipated.

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

用于单级放大器的单点检测回转速率增强电路

大多数压摆率增强电路既可以用于电流镜放大器，也可以用于折叠级联码放大器，但不能同时用于两者。本文提出了一种新型的摆率增强电路。通过在核心放大器的有源负载器件上采用单点检测技术来检测快速信号暂态，这种新型SRE电路既可用于电流镜放大器，也可用于折叠级联放大器。此外，简单的SRE电路作为核心放大器的插件功能，不影响其原有的小信号频率响应。采用AMS 0.6 /spl mu/m CMOS工艺实现的SRE电路电流镜放大器占地0.027 mm/sup 2/，在470pf容性负载下实现1.5 V//spl mu/s的摆率，而总静态电流仅耗散90 /spl mu/A。同样，带有SRE电路的折叠级联放大器占地0.03 mm/sup 2/，在470 pF负载下实现1.52 V//spl mu/s的摆率，而总静态电流仅消耗84 /spl mu/A。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文去求助

来源期刊

2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)

自引率

0.00%

发文量