The construction of probabilistic reliability model with one-shot device testing data

Abstract

Summary form only given. In this paper, the parametric and nonparametric approaches to construction of probabilistic reliability model with one-shot device testing data are considered. Such data are referred to as current status data, which include right censored and left censored observations (no complete observations at all). Statistical properties of maximum likelihood estimates of distribution parameters have been investigated. The algorithm for nonparametric estimation of unknown distribution function for such kind of data has been proposed.