Determination of band-gap narrowing in heavily doped n-type GaAs and n-type GaInP from solar cell performance

M. Ghannam, A. Al Omar, G. Flamand, N. Posthuma, J. Poortmans, R. Mertens
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Abstract

Band-gap narrowing (BGN) is determined in heavily doped n-type GaAs and n-type Ga/sub 0.5/In/sub 0.5/P from experimental pn junction solar cell performance. A BGN of 82 meV and of 17 meV is determined in GaAs with an n-type doping concentration of 2/spl times/10/sup 18//cm/sup 3/ and 10/sup 17//cm/sup 3/, respectively, and an average 95 meV BGN is determined in Ga/sub 0.5/In/sub 0.5/P with an n-type doping concentration of 3/spl times/10/sup 18//cm/sup 3/. These values agree well with theoretical predictions of a recent model applied to n-type GaAs and adapted here for Ga/sub 0.5/In/sub 0.5/P.
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从太阳能电池性能测定重掺杂n型GaAs和n型GaInP的带隙缩小
通过实验pn结太阳能电池性能测定了重掺杂n型GaAs和n型Ga/sub 0.5/ in /sub 0.5/P的带隙缩小(BGN)。在n型掺杂浓度为2/spl倍/10/sup 18//cm/sup 3/和10/sup 17//cm/sup 3/的GaAs中,测得的BGN分别为82 meV和17 meV;在n型掺杂浓度为3/spl倍/10/sup 18//cm/sup 3/的Ga/sub 0.5/ in /sub 0.5/P中,测得的BGN平均为95 meV。这些值与最近应用于n型GaAs的模型的理论预测一致,并适用于Ga/sub 0.5/In/sub 0.5/P。
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