{"title":"An equivalent circuit model for deep-trap induced drain-current transient behaviors in HJFETs","authors":"K. Kunihiro, Y. Ohno","doi":"10.1109/GAAS.1994.636982","DOIUrl":null,"url":null,"abstract":"A large-signal HJFET model is developed for deep-trap induced drain-current transient behaviors based on two-dimensional device simulations. In the model, electron capture and emission processes for deep traps are replaced by the currents flowing through a diode and a resistor, which are physically deduced from SRH statistics. The model accurately describes the bias and time dependent nonlinear-characteristics of trapping effects. The influence of the trapping effects on RF switching is also discussed.","PeriodicalId":328819,"journal":{"name":"Proceedings of 1994 IEEE GaAs IC Symposium","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE GaAs IC Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAAS.1994.636982","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
A large-signal HJFET model is developed for deep-trap induced drain-current transient behaviors based on two-dimensional device simulations. In the model, electron capture and emission processes for deep traps are replaced by the currents flowing through a diode and a resistor, which are physically deduced from SRH statistics. The model accurately describes the bias and time dependent nonlinear-characteristics of trapping effects. The influence of the trapping effects on RF switching is also discussed.
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