Novel Pre-applied Under-fill Material Specialized for Multiple Die Bonding Process

Masashi Okaniwa, Takenori Takiguchi, Kohei Higashiguchi, Takahito Sekido, K. Ihara, Tsuyoshi Kida, Shuuji Yoshida, T. Oshima
{"title":"Novel Pre-applied Under-fill Material Specialized for Multiple Die Bonding Process","authors":"Masashi Okaniwa, Takenori Takiguchi, Kohei Higashiguchi, Takahito Sekido, K. Ihara, Tsuyoshi Kida, Shuuji Yoshida, T. Oshima","doi":"10.1109/ESTC.2018.8546397","DOIUrl":null,"url":null,"abstract":"TCB (Thermal Compression Bonding) process with NCF (Non Conductive Film) is expected as an effective solution for fine pitch applications brought by the progress of IoT (Internet of Things), however the production volume is limited to small level because of its expensive assembly cost. To mitigate the cost impact, some multiple die bonding methods are being introduced by many players. So far, several NCFs were evaluated for these bonding processes, unfortunately, it is becoming clear that approaches coupled with conventional thermosetting resin compositions are very difficult to achieve required process-ability of the bonding processes due to miss-match between reactivity of the resins and process conditions. That is why the new type of pre-applied under-fill material specialized for multiple die bonding process was desired in the market and has been developed in this study. The developed NCF was designed to survive long time thermal exposure on a bonding stage of TCB bonder so that multiple die bonding such as collective bonding could be successfully performed with enough process margin. To achieve the target specifications, this study has started with the design of new resin composition applied to the developed NCF. Finally, TCB was demonstrated with the developed NCF and it was confirmed that reliable solder joints were formed and no abnormality was observed even after 180mins thermal exposure at 130degC on the bonding stage. Moreover, the developed NCF showed good insulation reliability in HAST. The final reliability tests on package level are ongoing and the results will be visible in no time.","PeriodicalId":198238,"journal":{"name":"2018 7th Electronic System-Integration Technology Conference (ESTC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 7th Electronic System-Integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2018.8546397","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

TCB (Thermal Compression Bonding) process with NCF (Non Conductive Film) is expected as an effective solution for fine pitch applications brought by the progress of IoT (Internet of Things), however the production volume is limited to small level because of its expensive assembly cost. To mitigate the cost impact, some multiple die bonding methods are being introduced by many players. So far, several NCFs were evaluated for these bonding processes, unfortunately, it is becoming clear that approaches coupled with conventional thermosetting resin compositions are very difficult to achieve required process-ability of the bonding processes due to miss-match between reactivity of the resins and process conditions. That is why the new type of pre-applied under-fill material specialized for multiple die bonding process was desired in the market and has been developed in this study. The developed NCF was designed to survive long time thermal exposure on a bonding stage of TCB bonder so that multiple die bonding such as collective bonding could be successfully performed with enough process margin. To achieve the target specifications, this study has started with the design of new resin composition applied to the developed NCF. Finally, TCB was demonstrated with the developed NCF and it was confirmed that reliable solder joints were formed and no abnormality was observed even after 180mins thermal exposure at 130degC on the bonding stage. Moreover, the developed NCF showed good insulation reliability in HAST. The final reliability tests on package level are ongoing and the results will be visible in no time.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
专门用于多模粘合工艺的新型预应用下填充材料
NCF (Non - Conductive Film)的TCB (Thermal Compression Bonding)工艺有望成为物联网(IoT)发展带来的小间距应用的有效解决方案,但由于其昂贵的组装成本,其产量限制在小水平。为了降低成本影响,许多厂商正在引入一些多模接合方法。到目前为止,对这些粘合过程的几种nfc进行了评估,不幸的是,越来越明显的是,由于树脂的反应性和工艺条件之间的不匹配,与传统热固性树脂组合物相结合的方法很难达到粘合过程所需的工艺能力。这就是为什么市场上需要专门用于多模粘合过程的新型预应用下填充材料的原因,并且在本研究中已经开发出来。所开发的NCF可以在TCB键合机的键合阶段经受长时间的热暴露,从而可以在足够的工艺裕度下成功地进行多模键合(如集体键合)。为了达到目标规格,本研究已经开始设计应用于开发的NCF的新树脂组合物。最后,利用开发的NCF验证了TCB,并证实在焊接阶段在130℃下热暴露180min后,形成了可靠的焊点,没有观察到异常。此外,所开发的NCF在HAST中表现出良好的绝缘可靠性。包级的最终可靠性测试正在进行中,很快就会看到结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Wafer Level Through Polymer Optical Vias (TPOV) Enabling High Throughput of Optical Windows Manufacturing ESTC 2018 TOC Calculation of local solder temperature profiles in reflow ovens Numerical and statistical investigation of weld formation in a novel two-dimensional copper-copper bonding process Nonconchoidal Fracture in Power Electronics Substrates due to Delamination in Baseplate Solder Joints
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1