Spectral response and SNR analysis of an Offner imaging spectrometer

Zhen-zhou Wu, Zhi-hong Ma
{"title":"Spectral response and SNR analysis of an Offner imaging spectrometer","authors":"Zhen-zhou Wu, Zhi-hong Ma","doi":"10.1117/12.900932","DOIUrl":null,"url":null,"abstract":"The Signal-to-Noise Ratio (SNR) is an important quantitative parameter for evaluating the capability of spectrometers. The noises of CMOS image sensor, stray light and radiometric distortion play important roles in the spectrometer's SNR performance. An Offner imaging spectrometer is designed and tested. By measuring the spectrometer's spectral response, its SNR is calculated by the traditional statistical method and the wavelet analysis. Both methods give similar result and can provide useful information during the spectrometer commissioning as well as performance evaluation.","PeriodicalId":355017,"journal":{"name":"Photoelectronic Detection and Imaging","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Photoelectronic Detection and Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.900932","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The Signal-to-Noise Ratio (SNR) is an important quantitative parameter for evaluating the capability of spectrometers. The noises of CMOS image sensor, stray light and radiometric distortion play important roles in the spectrometer's SNR performance. An Offner imaging spectrometer is designed and tested. By measuring the spectrometer's spectral response, its SNR is calculated by the traditional statistical method and the wavelet analysis. Both methods give similar result and can provide useful information during the spectrometer commissioning as well as performance evaluation.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Offner成像光谱仪的光谱响应和信噪比分析
信噪比(SNR)是评价光谱仪性能的重要定量参数。CMOS图像传感器噪声、杂散光和辐射畸变是影响光谱仪信噪比的重要因素。设计并测试了一台Offner成像光谱仪。通过测量光谱仪的光谱响应,利用传统的统计方法和小波分析计算其信噪比。两种方法的结果相似,可以为谱仪调试和性能评估提供有用的信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Design and characterization of radiation tolerant CMOS image sensor for space applications Measuring the steel tensile deformation based on linear CCD 3D hand and palmprint acquisition using full-field composite color fringe projection Research on surface free energy of electrowetting liquid zoom lens Research on inside surface of hollow reactor based on photoelectric detecting technique
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1