Design-for-test techniques

Abstract

There are many Design For Test techniques, and even a brief discussion on each would require considerable timer and effort. Therefore, this paper will only address the areas of Nodal Visibility and Built-in-Test. The area of nodal visibility addresses two methods of providing signal access points, and two methods of effectively increasing the number of signal access point by using some added circuitry. The BIT application section provides a method for testing the power supply voltage monitors to verify that a power supply failure will actually result in a failure indication and an example of a parallel data acquisition system.