{"title":"Neutron induced damage in linear integrated circuits: Ionizing effects contribution","authors":"B. Azais, D. Lopez, M. Vié","doi":"10.1109/RADECS.1997.698898","DOIUrl":null,"url":null,"abstract":"This work deals with the impact of ionizing dose induced damage in linear junction isolated integrated circuits (JIICs) when exposed to neutron irradiations. A very low contribution of ionizing effects is shown for standard neutron test conditions.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"28 5","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1997.698898","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This work deals with the impact of ionizing dose induced damage in linear junction isolated integrated circuits (JIICs) when exposed to neutron irradiations. A very low contribution of ionizing effects is shown for standard neutron test conditions.
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