Digital Correction of DAC Nonlinearity in Multi-Bit Feedback A/D Converters: Invited tutorial

P. Payandehnia, Tao He, Yanchao Wang, G. Temes
{"title":"Digital Correction of DAC Nonlinearity in Multi-Bit Feedback A/D Converters: Invited tutorial","authors":"P. Payandehnia, Tao He, Yanchao Wang, G. Temes","doi":"10.1109/CICC48029.2020.9075916","DOIUrl":null,"url":null,"abstract":"In many data converter structures, an embedded digital-to-analog converter (DAC) is a key block, and its mismatch and dynamic errors limit the overall accuracy of the operation. Examples include multi-bit ΔΣ and incremental analog-to-digital converters (ADCs) and successive-approximation-register (SAR) ADCs. In this paper, an overview of existing methods for correcting or mitigating the effects of DAC imperfections is presented. Also, a new foreground digital correction method is described for the mitigation of static mismatch errors in the binary-weighted DAC of a multi-bit ΔΣ or incremental ADC. With minor modifications the correction processes can also be applied to the DAC of a SAR ADC, and the tuning of passive elements used in data converters.","PeriodicalId":409525,"journal":{"name":"2020 IEEE Custom Integrated Circuits Conference (CICC)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Custom Integrated Circuits Conference (CICC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC48029.2020.9075916","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

In many data converter structures, an embedded digital-to-analog converter (DAC) is a key block, and its mismatch and dynamic errors limit the overall accuracy of the operation. Examples include multi-bit ΔΣ and incremental analog-to-digital converters (ADCs) and successive-approximation-register (SAR) ADCs. In this paper, an overview of existing methods for correcting or mitigating the effects of DAC imperfections is presented. Also, a new foreground digital correction method is described for the mitigation of static mismatch errors in the binary-weighted DAC of a multi-bit ΔΣ or incremental ADC. With minor modifications the correction processes can also be applied to the DAC of a SAR ADC, and the tuning of passive elements used in data converters.
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多位反馈A/D转换器中DAC非线性的数字校正:特邀讲座
在许多数据转换器结构中,嵌入式数模转换器(DAC)是一个关键模块,其失配和动态误差限制了操作的整体精度。示例包括多位ΔΣ和增量模数转换器(adc)和逐次逼近寄存器(SAR) adc。在本文中,概述了纠正或减轻DAC缺陷影响的现有方法。此外,本文还描述了一种新的前景数字校正方法,用于缓解多比特ΔΣ或增量ADC的二进制加权DAC中的静态失配误差。修正过程也可以应用于SAR ADC的DAC,以及数据转换器中使用的无源元件的调谐。
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