{"title":"Automated bias-removal resistance measurement circuit for precision on-site temperature calibration exploitation of state changes of materials","authors":"Ciaran Doyle, D. Riordan, Joseph Walsh","doi":"10.1109/ICSENST.2015.7438398","DOIUrl":null,"url":null,"abstract":"An innovative process is proposed for the calibration of thermometric devices, combining materials which change state at primary temperature calibration points defined in international standards, and electrical impedance measurement techniques. The process will use pure samples of such materials and a measurement apparatus which enables the automated matching of the elimination of measurement bias to each of a number of calibration points, improving resolution and accuracy. The proposed process will be low-cost to allow implementation and regular calibration of temperature sensing and controlled devices in a standard manufacturing process.","PeriodicalId":375376,"journal":{"name":"2015 9th International Conference on Sensing Technology (ICST)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 9th International Conference on Sensing Technology (ICST)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSENST.2015.7438398","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
An innovative process is proposed for the calibration of thermometric devices, combining materials which change state at primary temperature calibration points defined in international standards, and electrical impedance measurement techniques. The process will use pure samples of such materials and a measurement apparatus which enables the automated matching of the elimination of measurement bias to each of a number of calibration points, improving resolution and accuracy. The proposed process will be low-cost to allow implementation and regular calibration of temperature sensing and controlled devices in a standard manufacturing process.