Study of electron and ion emission from heated ceramics

E. Takahashi, H. Mitsui, M. Sone
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Abstract

Thermionic emission from heated ceramics (Al/sub 2/O/sub 3/, ZrO/sub 2/, and Si/sub 3/N/sub 4/,) and was measured using a microchannel plates (MCP). The thermionic emission was measured from all samples by using an MCP in the 10/sup -18/[A]-10/sup -11/[A] region. The electron and positive ion were caused by vaporization of silicon or silicate contained in the ceramics as additive materials.<>
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加热陶瓷中电子和离子发射的研究
利用微通道板(MCP)测量了加热陶瓷(Al/sub 2/O/sub 3/, ZrO/sub 2/和Si/sub 3/N/sub 4/)的热离子发射。用MCP在10/sup -18/[A]-10/sup -11/[A]区域测量所有样品的热离子发射。电子和正离子是由陶瓷中所含的硅或硅酸盐作为添加材料汽化产生的。
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