ADEV Calculated from Phase Noise Measurements and Its Possible Errors Due to FFT Sampling

Do-Cheng Chang, Shang-Shian Chen, Shinn-Yan Lin
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Abstract

In this paper, we show that fast Fourier transform (FFT) sampling plays an important role in the calculation of Allan deviation (ADEV) while using the numerical integration as a tool for the time and frequency (T&F) conversion. In order to avoid generation of unreasonable ADEV values, FFT sampling data are re-generated with logarithmic frequency space using an interpolation skill. Therefore, results from both the numerical integration and the power-law processes could match each other quite well. Besides, spurs in spectral density have non-neglectful influences upon ADEV results. For example, when the data of our lab's phase noise measurement system are processed, the ADEV generated from the spectral density with spurs may reach to three times the one while spurs are removed
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从相位噪声测量计算ADEV及其由于FFT采样可能产生的误差
在本文中,我们证明了快速傅里叶变换(FFT)采样在计算艾伦偏差(ADEV)中起着重要的作用,同时使用数值积分作为时间和频率(T&F)转换的工具。为了避免产生不合理的ADEV值,利用插值技术对对数频率空间重新生成FFT采样数据。因此,数值积分和幂律过程的结果可以很好地吻合。此外,谱密度中的杂散对ADEV结果也有不可忽视的影响。例如,在处理本实验室相位噪声测量系统的数据时,有杂散的谱密度产生的ADEV可以达到去除杂散时的三倍
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