The influence of slot position on the shielding degradation of metallic enclosures

F. Schlagenhaufer, J. He, K. Fynn
{"title":"The influence of slot position on the shielding degradation of metallic enclosures","authors":"F. Schlagenhaufer, J. He, K. Fynn","doi":"10.1109/ICSMC2.2003.1428338","DOIUrl":null,"url":null,"abstract":"The shielding performance of metallic enclosures at high frequencies is dominated by coupling through openings, especially long slots. In cases, where the size and shape of slots cannot be modified due to functional criteria, it may be possible to influence their position and orientation and the location of critical components inside the enclosure, and so to minimise the shielding degradation. In this paper, the influence of the slot position and source location, on the shielding performance of a metallic enclosure is investigated by means of numerical simulations. From the analysis results, general design guidelines are then developed","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSMC2.2003.1428338","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The shielding performance of metallic enclosures at high frequencies is dominated by coupling through openings, especially long slots. In cases, where the size and shape of slots cannot be modified due to functional criteria, it may be possible to influence their position and orientation and the location of critical components inside the enclosure, and so to minimise the shielding degradation. In this paper, the influence of the slot position and source location, on the shielding performance of a metallic enclosure is investigated by means of numerical simulations. From the analysis results, general design guidelines are then developed
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
槽位对金属外壳屏蔽性能退化的影响
金属外壳在高频下的屏蔽性能主要取决于通过开口,特别是长槽的耦合。在由于功能标准而不能修改槽的尺寸和形状的情况下,可能会影响槽的位置和方向以及关键部件在外壳内的位置,从而最大限度地减少屏蔽性能的降低。本文采用数值模拟的方法,研究了槽位和源位对金属外壳屏蔽性能的影响。根据分析结果,制定通用设计准则
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Lightning current and overvoltage withstand capacity test of low voltage systems facility wiring MST measurement technique for EMC calibrations and exposure hazard evaluation Modified Smith-chart representation as applied to microstrip antenna design for wireless LAN applications Time-domain treatment of multi-layer soil in transient analysis of aerial multi-conductor transmission lines Can portable electronic devices (PEDs) interfere with aircraft systems?
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1