{"title":"Development of the MPD fast forward detector electronics test bench","authors":"I.N. Eremkina, V. Rogov, S. Sergeev, V. Yurevich","doi":"10.1063/5.0064485","DOIUrl":null,"url":null,"abstract":"A test bench for the Front-End Electronics (FEE) of the Fast Forward Detector (FFD), which is a part of the Multi-Purpose Detector (MPD) facility, has been developed. The test bench includes a FEE testing card and two types of pulse generators. The FEE testing card and one signal generator are used for the front-end board parameters check. This procedure includes verification of the channel gain, the pulse shape and width, the FEE working conditions, etc. The second one is Low-Voltage Differential Signaling (LVDS) generator intended for Signal Processing Module (SPM) testing with special software. This procedure includes checking the SPM signal processing algorithms.","PeriodicalId":296008,"journal":{"name":"PROCEEDINGS OF THE 24TH INTERNATIONAL SCIENTIFIC CONFERENCE OF YOUNG SCIENTISTS AND SPECIALISTS (AYSS-2020)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"PROCEEDINGS OF THE 24TH INTERNATIONAL SCIENTIFIC CONFERENCE OF YOUNG SCIENTISTS AND SPECIALISTS (AYSS-2020)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/5.0064485","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A test bench for the Front-End Electronics (FEE) of the Fast Forward Detector (FFD), which is a part of the Multi-Purpose Detector (MPD) facility, has been developed. The test bench includes a FEE testing card and two types of pulse generators. The FEE testing card and one signal generator are used for the front-end board parameters check. This procedure includes verification of the channel gain, the pulse shape and width, the FEE working conditions, etc. The second one is Low-Voltage Differential Signaling (LVDS) generator intended for Signal Processing Module (SPM) testing with special software. This procedure includes checking the SPM signal processing algorithms.
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