{"title":"An equivalent circuit model for the coplanar waveguide step discontinuity","authors":"C. Sinclair, S. Nightingale","doi":"10.1109/MWSYM.1992.188286","DOIUrl":null,"url":null,"abstract":"An approximate analytical model for the CPW (coplanar waveguide) step discontinuity is presented which includes a lumped shunt capacitance as the dominant effect. Good agreement is obtained with data from extensive 3-D field simulations, and verified by a limited number of measurements on alumina. The magnitude of the discontinuity is found to be smaller than indicated in previous work, but it is nevertheless of the same order as a microstrip step in a comparable situation. These effects need to be taken into account in any serious design, and the model presented, when incorporated into CAD (computer-aided design) circuit analysis programs, will allow rapid evaluation of performance.<<ETX>>","PeriodicalId":165665,"journal":{"name":"1992 IEEE Microwave Symposium Digest MTT-S","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 IEEE Microwave Symposium Digest MTT-S","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1992.188286","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15
Abstract
An approximate analytical model for the CPW (coplanar waveguide) step discontinuity is presented which includes a lumped shunt capacitance as the dominant effect. Good agreement is obtained with data from extensive 3-D field simulations, and verified by a limited number of measurements on alumina. The magnitude of the discontinuity is found to be smaller than indicated in previous work, but it is nevertheless of the same order as a microstrip step in a comparable situation. These effects need to be taken into account in any serious design, and the model presented, when incorporated into CAD (computer-aided design) circuit analysis programs, will allow rapid evaluation of performance.<>
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