G. Razé, J. Néauport, G. Dupuy, M. Balas, G. Mennerat, E. Lavastre
{"title":"Short pulse laser damage measurements of pulse compression gratings for petawatt laser","authors":"G. Razé, J. Néauport, G. Dupuy, M. Balas, G. Mennerat, E. Lavastre","doi":"10.1117/12.752783","DOIUrl":null,"url":null,"abstract":"An optical bench was developed to measure laser induced damage thresholds in 1:1 and S:1 modes on mirror and grating samples. The laser based on Ti. Sapphire technology delivers Gaussian pulse of 500fs with a maximal energy of 3mJ at 1057nm. The experimental setup can deliver on the sample a peak fluence of 9J/cm2 in right section of the beam with a spot size of 200μm (diameter at 1/e2). Laser induced damage thresholds have been measured on several multidielectric samples produced with different processes. We present in this paper the damage testing setup in details and give some of the obtained results.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Laser Damage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.752783","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
An optical bench was developed to measure laser induced damage thresholds in 1:1 and S:1 modes on mirror and grating samples. The laser based on Ti. Sapphire technology delivers Gaussian pulse of 500fs with a maximal energy of 3mJ at 1057nm. The experimental setup can deliver on the sample a peak fluence of 9J/cm2 in right section of the beam with a spot size of 200μm (diameter at 1/e2). Laser induced damage thresholds have been measured on several multidielectric samples produced with different processes. We present in this paper the damage testing setup in details and give some of the obtained results.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
