Impact of photon recycling and luminescence coupling in III-V photovoltaic devices

A. Walker, O. Höhn, D. Micha, L. Wagner, H. Helmers, A. Bett, F. Dimroth
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引用次数: 13

Abstract

Single junction photovoltaic devices composed of direct bandgap III-V semiconductors such as GaAs can exploit the effects of photon recycling to achieve record-high open circuit voltages. Modeling such devices yields insight into the design and material criteria required to achieve high efficiencies. For a GaAs cell to reach 28 % efficiency without a substrate, the Shockley-Read-Hall (SRH) lifetimes of the electrons and holes must be longer than 3 s and 100 ns respectively in a 2 μm thin active region coupled to a very high reflective (>99%) rear-side mirror. The model is generalized to account for luminescence coupling in tandem devices, which yields direct insight into the top cell’s non-radiative lifetimes. A heavily current mismatched GaAs/GaAs tandem device is simulated and measured experimentally as a function of concentration between 3 and 100 suns. The luminescence coupling increases from 14 % to 33 % experimentally, whereas the model requires an increasing SRH lifetime for both electrons and holes to explain these experimental results. However, intermediate absorbing GaAs layers between the two sub-cells may also increasingly contribute to the luminescence coupling as a function of concentration.
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光子回收和发光耦合对III-V型光伏器件的影响
由直接带隙III-V半导体(如GaAs)组成的单结光伏器件可以利用光子回收的效应来实现创纪录的高开路电压。对此类设备进行建模可以深入了解实现高效率所需的设计和材料标准。对于没有衬底的砷化镓电池,电子和空穴的Shockley-Read-Hall (SRH)寿命必须分别大于3s和100 ns,在2 μm薄的有源区耦合到一个非常高反射(>99%)的后视镜。该模型被推广到考虑串联器件中的发光耦合,从而直接了解顶部电池的非辐射寿命。模拟和实验测量了一个大电流失配的GaAs/GaAs串联器件在3到100个太阳之间的浓度函数。在实验中,发光耦合从14%增加到33%,而该模型需要电子和空穴的SRH寿命增加来解释这些实验结果。然而,两个亚细胞之间的中间吸收GaAs层也可能作为浓度的函数越来越多地促进发光耦合。
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