The high-performance linear scan imaging system of terahertz Si-based blocked-impurity-band detector

Jianqing Wu, Jiajia Tao, Chuansheng Zhang, Haoxing Zhang, Lei Zhang, Dong Chen, Xiaodong Wang
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引用次数: 1

Abstract

Terahertz (THz) Si-based blocked-impurity-band (BIB) detector is becoming the overwhelming choice for applications in space-based instruments, airborne, and imaging systems. A high-performance linear scan imaging system based on the THz Si-based BIB detector is designed. Through the optimized design of cryogenic Dewar and a suitable optical system, the imaging system reduces background stray radiation, and then improves the THz imaging performance of the detector. At the temperature of 4.2 K and the bias of 2.6V, the blackbody peak responsivity of the Si-based BIB detector is 23.77A/W, while the dark current is 4.72 × 10 − 11 A and the corresponding responsivity non-uniformity is less than 6.8%. Moreover, the experiment results show that the noise equivalent temperature difference (NETD) of the whole system reaches 10mK, and the spatial resolution reaches 50 µm. This work is beneficial to the larger scale array integrated BIB imaging system.
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太赫兹硅基阻塞杂质带探测器的高性能线性扫描成像系统
太赫兹(THz)硅基阻塞杂质带(BIB)探测器正成为天基仪器、机载和成像系统应用的压倒性选择。设计了一种基于太赫兹硅基BIB探测器的高性能线性扫描成像系统。通过对低温杜瓦的优化设计和合适的光学系统,成像系统降低了背景杂散辐射,从而提高了探测器的太赫兹成像性能。在温度为4.2 K、偏置为2.6V时,硅基BIB探测器的黑体峰值响应率为23.77A/W,暗电流为4.72 × 10−11 A,响应率不均匀性小于6.8%。实验结果表明,整个系统的噪声等效温差(NETD)达到10mK,空间分辨率达到50µm。本文的工作对大规模阵列集成BIB成像系统的研制具有一定的指导意义。
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