{"title":"On the design of a resistive bridging fault testable two-rail checker","authors":"M. Olson, Xiaoling Sun","doi":"10.1109/CCECE.1995.528090","DOIUrl":null,"url":null,"abstract":"This paper describes the design of a built-in current sensor that is used to enhance the resistive bridging fault detectability of a static CMOS TSC two-rail checker. The design and operation of the sensor is discussed. The performance of the sensor-equipped checker is evaluated and compared to a previously designed checker.","PeriodicalId":158581,"journal":{"name":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.1995.528090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper describes the design of a built-in current sensor that is used to enhance the resistive bridging fault detectability of a static CMOS TSC two-rail checker. The design and operation of the sensor is discussed. The performance of the sensor-equipped checker is evaluated and compared to a previously designed checker.
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