S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol
{"title":"Modeling basic tip forms and its field emission","authors":"S. Filippov, E. O. Popov, A. G. Kolosko, F. F. Dall’Agnol","doi":"10.1109/IVNC49440.2020.9203096","DOIUrl":null,"url":null,"abstract":"The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.","PeriodicalId":292538,"journal":{"name":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","volume":"201 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 33rd International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC49440.2020.9203096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
The field enhancement factor (FEF) is an important parameter in field emission studies. There are many approaches from several authors to depict the FEF, each with a proposed formula for a specific emitter shape. In this work, we group the FEF from the main emitter shapes in the literature. In these shapes, we analyze the emission current, electric field distribution on the emitter, among other properties.
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