Silicon Cavity at 4 Kelvin with Thermal Noise Limited Performance

J. Robinson, E. Oelker, W. Zhang, L. Sonderhouse, W. Milner, J. L. Hall, C. Sanner, J. Ye, D. Matei, T. Legero, F. Riehle, U. Sterr
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Abstract

We present the thermal noise limited performance of a cryogenic ultrastable silicon optical cavity operated at 4 K. A three-cornered comparison with two other ultrastable resonantors shows that the 4 K system is largely limited by a flicker frequency floor near $7\times 10^{-17}$ for averaging times from 5 seconds to 30 seconds.
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硅腔在4开尔文与热噪声有限的性能
研究了低温超稳定硅光学腔在4k下的热噪声限制性能。与其他两个超稳谐振器的三角比较表明,4 K系统在5秒到30秒的平均时间内,很大程度上受到7\ × 10^{-17}$附近的闪烁频率下限的限制。
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