{"title":"Grounding Considerations for RFIC Automated Handling Equipment Testing","authors":"L. H. Koh, Y. H. Goh","doi":"10.23919/EOS/ESD.2018.8509786","DOIUrl":null,"url":null,"abstract":"This paper describes the grounding cables selection process in mitigating random degradation of more than 200 automated tester handlers’ parametric test yield in a back-end semiconductor factory, testing Radio Frequency Integrated Circuit ESD sensitive devices, due to stochastic high frequency ground current noise issues.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509786","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper describes the grounding cables selection process in mitigating random degradation of more than 200 automated tester handlers’ parametric test yield in a back-end semiconductor factory, testing Radio Frequency Integrated Circuit ESD sensitive devices, due to stochastic high frequency ground current noise issues.